|  | ASIM team LIP6 Laboratory Paris, France |  | 
 
 
 
 
 
 
 
  
| 4|l|PARALLEL PORTS : port 0 and port 1 | |||
|---|---|---|---|
| Pin name | I/O | Active level | Brief Description | 
| datastrobe0 | I | - | write strobe of the input asynchronous fifo. | 
| datain0[8:0] | I | - | incoming character on parallel port 0. | 
| fccreceived0 | I | high | adds a flit to the emission credit of the port 0. | 
| sendfcc0 | O | high | Port 0 can receive a flit. | 
| senddata0 | O | high | Data sending flag. | 
| dataout0[8:0] | O | - | outgoing character from parallel port 0. | 
| muxps0 | I | high | selects the parallel input on link 0. | 
| datastrobe1 | I | - | write strobe of the input asynchronous fifo. | 
| datain1[8:0] | I | - | incoming character on parallel port 1. | 
| fccreceived1 | I | high | adds a flit to the emission credit of the port 1. | 
| sendfcc1 | O | high | Port 1 can receive a flit. | 
| senddata1 | O | high | Data sending flag. | 
| dataout1[8:0] | O | - | outgoing character from parallel port 1. | 
| muxps1 | I | high | selects the parallel input on link 1. | 
| 4|l|TEST PINS | |||
|---|---|---|---|
| Pin name | I/O | Active level | Brief Description | 
| test | I | high | All the functional registers of R3P are controlable and observable through a scanpath. The clock used in test mode is the functional clock ckin. | 
| scanin | I | - | R3P Scanpath input. | 
| scanout | O | - | R3P Scanpath output. | 
| test_smi | I | high | The functional registers of the SMIs clocked by the clock ckin are controlable and observable through a scanpath. The clock used in test mode is the functional clock ckin. | 
| scanin_smi | I | - | SMIs Scanpath input. | 
| scanout_smi | O | - | SMIs Scanpath output. | 
| test_hsl | I | low | enables the scanning of each register of the HSLs through a test scanpath. | 
| scanin_hsl | I | - | input of the test scanpath of the HSLs. | 
| scanout_hsl | O | - | output of the test scanpath of the HSLs. | 
| zctest | I | low | enables the scanning of each register of the ZC block through a dedicated test scanpath. | 
| zcscin | I | - | input of the ZC test scanpath. | 
| zcscout | O | - | output of the ZC test scanpath. | 
| loop_par[7:0] | I | high | enables a direct connection between the output and the input of the SMIs before entering the HSLs. | 
| loop_ser[7:0] | I | low | enables an internal loop back between the serial output and the serial input of each HSL. | 
| ckm1,ckm2 | I | - | HSLs, ZC block test clocks. | 
| zin,zou | I | - | must be externally connected via a 100 ohm resistor. | 
TOTAL: 138 pins
 
 
 
 
 
 
 
  
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