ASIM team
LIP6 Laboratory Paris, France |
4|l|PARALLEL PORTS : port 0 and port 1 | |||
---|---|---|---|
Pin name | I/O | Active level | Brief Description |
datastrobe0 | I | - | write strobe of the input asynchronous fifo. |
datain0[8:0] | I | - | incoming character on parallel port 0. |
fccreceived0 | I | high | adds a flit to the emission credit of the port 0. |
sendfcc0 | O | high | Port 0 can receive a flit. |
senddata0 | O | high | Data sending flag. |
dataout0[8:0] | O | - | outgoing character from parallel port 0. |
muxps0 | I | high | selects the parallel input on link 0. |
datastrobe1 | I | - | write strobe of the input asynchronous fifo. |
datain1[8:0] | I | - | incoming character on parallel port 1. |
fccreceived1 | I | high | adds a flit to the emission credit of the port 1. |
sendfcc1 | O | high | Port 1 can receive a flit. |
senddata1 | O | high | Data sending flag. |
dataout1[8:0] | O | - | outgoing character from parallel port 1. |
muxps1 | I | high | selects the parallel input on link 1. |
4|l|TEST PINS | |||
---|---|---|---|
Pin name | I/O | Active level | Brief Description |
test | I | high | All the functional registers of R3P are controlable and observable through a scanpath. The clock used in test mode is the functional clock ckin. |
scanin | I | - | R3P Scanpath input. |
scanout | O | - | R3P Scanpath output. |
test_smi | I | high | The functional registers of the SMIs clocked by the clock ckin are controlable and observable through a scanpath. The clock used in test mode is the functional clock ckin. |
scanin_smi | I | - | SMIs Scanpath input. |
scanout_smi | O | - | SMIs Scanpath output. |
test_hsl | I | low | enables the scanning of each register of the HSLs through a test scanpath. |
scanin_hsl | I | - | input of the test scanpath of the HSLs. |
scanout_hsl | O | - | output of the test scanpath of the HSLs. |
zctest | I | low | enables the scanning of each register of the ZC block through a dedicated test scanpath. |
zcscin | I | - | input of the ZC test scanpath. |
zcscout | O | - | output of the ZC test scanpath. |
loop_par[7:0] | I | high | enables a direct connection between the output and the input of the SMIs before entering the HSLs. |
loop_ser[7:0] | I | low | enables an internal loop back between the serial output and the serial input of each HSL. |
ckm1,ckm2 | I | - | HSLs, ZC block test clocks. |
zin,zou | I | - | must be externally connected via a 100 ohm resistor. |
TOTAL: 138 pins
Server design A. Fenyö
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